Fuzzy based technique for microchip lead inspection using machine vision

Please use this identifier to cite or link to this item: http://repository.elizadeuniversity.edu.ng/jspui/handle/20.500.12398/622

Title:	Fuzzy based technique for microchip lead inspection using machine vision
Authors:	Hawari, Yasser Salami, Momoh-Jimoh E. Aburas, Abdurazzag A.
Keywords:	Inspection, Machine vision Filters Charge coupled devices Image edge detection Feature extraction Inference algorithms Manufacturing Computer vision Mechatronics
Issue Date:	13-May-2008
Publisher:	IEEE
Citation:	Hawari, Y., Salami, M. J., & Aburas, A. A. (2008, May). Fuzzy based technique for microchip lead inspection using machine vision. In 2008 International Conference on Computer and Communication Engineering (pp. 1222-1226). IEEE.
Abstract:	This research develops a fuzzy based algorithm for microchip image lead Inspection. Leads are inspected for count, planarity, offset, pitch and span defects. Firstly, it utilizes fast preprocessing techniques and blobspsila features extraction methods to achieve high inspection rates. Using the features extracted, the algorithm first finds a proper thresholding value. It then applies fuzzy logic to make a decision on the status of the IC based on these features. The algorithm proposes a structured way for building the fuzzy systems as well as the associated set of inference rules.
URI:	10.1109/ICCCE.2008.4580800 http://repository.elizadeuniversity.edu.ng/jspui/handle/20.500.12398/622
Appears in Collections:	Research Articles

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